Bragg Reflection is a phenomenon that occurs when X-rays or other forms of electromagnetic radiation are scattered by a crystalline material. It is based on the principle of constructive interference, which happens when waves reflected from the crystal planes meet in-phase. According to Bragg's law, this condition can be mathematically expressed as:
where is an integer (the order of reflection), is the wavelength of the incident X-rays, is the distance between the crystal planes, and is the angle of incidence. When these conditions are satisfied, the intensity of the reflected waves is significantly increased, allowing for the determination of the crystal structure. This technique is widely utilized in X-ray crystallography to analyze materials and molecules, enabling scientists to understand their atomic arrangement and properties in great detail.
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